S. Bette, S.Fichtner, S. Bröker, L. Nielen, T. Schmitz-Kempen, B. Wagner, C. Van Buggenhout, S. Tiedke, S. Tappertzhofen: Infrared-Laser based Characterization of the Pyroelectricity in AlScN Thin-Films, 2019, Thin Solid Films, Volume 692, 137623 |
G. Di Martino, S. Tappertzhofen: Optically accessible memristive devices, 2019, Nanophotonics, 8 (10), 1579 – 1589 |
S. Tappertzhofen, G. Di Martino, S. Hofmann: Nanoparticle Dynamics in Oxide-Based Memristive Devices, 2019, physica status solidi (a), Invited, 217, 1900587 |
A. Gumprich, F. M. Münchenberger, K. T. Kallis, J. Knoch: Improved nanowire alignment through frequency-varying dielectrophoresis, 44th International Conference on Micro- and Nanoengineering (MNE'18), Copenhagen, Denmark 2018, September 24-27 (peer reviewed) |
D. Merten, K. T. Kallis, F. J. Giebel,J. Zimmermann, R.P. Poloczek, H. L. Fiedler and P. Lilienthal: Lithography independent nanostructuring of Bi2Te3 Thermoelectric Devices, Proceedings of the 14th International IEEE India Council International Conference, IIT Roorkee, India 2017, December 15-17, in press (peer reviewed) |
S. Tappertzhofen, S. Hofmann: Embedded nanoparticle dynamics and their influence on switching behaviour of resistive memory devices, 2017, Nanoscale, 8 (48), 33072–33082 |
W. Chen, S. Tappertzhofen, H. J. Barnaby, M. N. Kozicki: SiO2 based conductive bridging random access memory, 2017, Journal of Electroceramics, 1-23 |
P. Czyba, F. J. Giebel, C. M. Zimmer, K. T. Kallis, and H. L. Fiedler: Manufacturing a Stacked Nanoscale Fishing Electrode for Gas Sensor Applications Using Freely Suspended Structures, Quantum Matter, Volume 6, Number 1, February 2017, pp. 54-58 (peer reviewed), doi: 10.1166/qm.2017.1398 |
K. T. Kallis, M. R. Müller, J. Knoch, A. Gumprich and D. Merten: Electrostatic Doping of 2D-Materials – From Single Devices Toward Circuitry Exploration, Quantum Matter, Volume 6, Number 1, February 2017, pp. 45-49 (peer reviewed) |
R. Wang, P. R. Whelan, P. Braeuninger-Weimer, S. Tappertzhofen, J. A. Alexander-Webber, Z. A. Van Veldhoven, P. R. Kidambi, B. S. Jessen, T. Booth, P. Bøggild, S. Hofmann: Catalyst Interface Engineering for Improved 2D Film Lift-Off and Transfer, 2016, ACS Applied Materials & Interfaces, 8 (48), 33072–33082 |
S. Cho, C. Yun, S. Tappertzhofen, A. Kursumovic, S. Lee, P. Lu, Q. Jia, M. Fan, J. Jian, H. Wang, S. Hofmann, J. L. MacManus-Driscoll: Self-assembled oxide films with tailored nanoscale ionic and electronic, 2016, Nature Communications, 7, 12373 |
K. T. Kallis, M. R. Müller, J. Knoch, A. Gumprich, D. Merten: Electrostatic Doping of 2D-materials - from single devices toward circuitry exploration, 5th International Conference from Nanoparticles and Nanomaterials to Nanodevices and Nanosystems 2016, Porto Heli, Greece 2016, June 26-30 |
F. J. Giebel, M. Köhle, P. Czyba, K. J. Kolander, K. T. Kallis, C. M. Zimmer, H. L. Fiedler: Fabricating freely suspended structures optimized regarding mechanical and electrochemical stability for sensor applications, Microelectronic Engineering 159 (2016), pp. 202–208, doi: 10.1016/j.mee.2016.04.010 |
G. Di Martino, S. Tappertzhofen, S. Hofmann, J. Baumberg: Nanoscale Plasmon-enhanced spectroscopy in Memristive Switches, 2016, Small, 12, 10, 1334-1341 |
T. Tsuruoka, I. Valov, S. Tappertzhofen, J. van den Hurk, T. Hasegawa, R. Waser, M. Aono: Redox Reactions at Cu,Ag/Ta2O5 Interfaces and the Effects of Ta2O5 Film Density on the Forming Process in Atomic Switch Structures, 2015, Advanced Functional Materials, Volume 25, 40, pp. 6374-6381 |
M. R. Müller, A. Gumprich, E. Ecik, K. T. Kallis, F. Winkler, B. Kardynal, I. Petrov, U. Kunze, J. Knoch: Visibility of two-dimensional layered materials on various substrates, Journal of applied physics 118.14 (2015): 145305 |
L. Nielen, A. Siemon, S. Tappertzhofen, R. Waser, S. Menzel, E. Linn: Study of Memristive Associative Capacitive Networks for CAM Applications, 2015, IEEE Journal of Emerging and Selected Topics in Circuits and Systems, 5, 2, 153-161 |
S. Tappertzhofen, E. Linn, S. Menzel, A.J. Kenyon, R. Waser, I. Valov: Modeling of Quantized Conductance Effects in Electrochemical Metallization Cells, 2015, IEEE Transactions on Nanotechnology, 14, 3, 505-5012 |
S. Ebschke, J. Zimmermann, A. Wiggershaus, K. T. Kallis, H. L. Fiedler: Test environment for characterization of a nanoscale sensor system consisting of fluid flow sensors based on the Thermal-Time-of-Flight (TToF) principle and absolute pressure sensors, Proceedings of the 2014 IEEE Sensors Conference, Valencia, Spain 2014, November 02-05, pp. 1340-1343 |
S. Tappertzhofen, R. Waser, I. Valov: Impact of Counter Electrode Material on the Redox Processes in Resistive Switching Memories, 2014, ChemElectroChem, 1, 8, 1287-1292 |
I.Valov, S. Tappertzhofen, E. Linn, S. Menzel, J. van den Hurk, R. Waser: Chemically-inactive interfaces in thin film Ag/AgI systems for resistive switching memories, 2014, ECS Transactions , 64, 14, 3-18 |
Y. Yang, P. Gao, L. Li, X. Pan, S. Tappertzhofen, S. H. Choi, R. Waser, I. Valov, W. D. Lu: Electrochemical dynamics of nanoscale metallic inclusions in dielectrics, 2014, Nature Communications, 5, 4232, 1-9 |
M. R. Müller, A. Gumprich, F. Schütte, K. T. Kallis, U. Künzelmann, S. Engels, C. Stampfer, N. Wilcke, J. Knoch: Buried triple-gate structures for advanced field-effect transistor devices, Microelectronic Engineering, Volume 119 (May 2014), pp. 95-99 |
S. Brabender, K. Kolander, K. T. Kallis, H. L. Fiedler: Wafer Extension for Cost-Effective Front to Back Side Alignment, Journal of Nano Research, Volume 27 (2014), pp. 1-4 |
S. Tappertzhofen, E. Linn, U. Böttger, R. Waser, I. Valov: Nanobattery Effect in RRAMs - Implications on Device Stability and Endurance, 2013, IEEE Electron Device Letters, Volume 35, S. 208-210 |
D.Y. Cho, S. Tappertzhofen, R. Waser, I. Valov: Chemically-inactive interfaces in thin film Ag/AgI systems for resistive switching memories, 2013, Scientific Reports, Volume 3, S.1169 |
S. Tappertzhofen, I. Valov, T. Tsuruoka, T. Hasegawa, R. Waser, M. Aono: Generic Relevance of Counter Charges for Cation-Based Nanoscale Resistive Switching Memories, 2013, ACS Nano, Volume 7, S. 6396-6402 |
D.Y. Cho, S. Tappertzhofen, R. Waser, I. Valov: Bond Nature of Active Metal Ions in SiO2-based Electrochemical Metallization Memory Cells, 2013, Nanoscale, Volume 5, S. 1781-1784 |
O. Kavehei, E. Linn, L. Nielen, S. Tappertzhofen, E. Skafidas, I. Valov, R. Waser: An associative capacitive network based on nanoscale complementary resistive switches for memory-intensive computing, 2013, Nanoscale, Volume 5, S. 5119-5128 |
S. Tappertzhofen, R. Waser, I. Valov: New insights into redox based resistive switches, 2013, Non-Volatile Memory Technology Symposium Proceedings, 1-5 |
S. Menzel, S. Tappertzhofen, R. Waser, I. Valov: Switching Kinetics of Electrochemical Metallization Memory Cells, 2013, Physical Chemistry Chemical Physics, Volume 15, pp. 6945-6952 |
I. Valov, S. Tappertzhofen, E. Linn, R. Waser: The Role of Electrochemical Interfaces in ReRAM Memory Cells, 2013, ECS Transactions, Volume 58, S. 189-196 |
I. Valov, E. Linn, S. Tappertzhofen, S. Schmelzer, J. Van Den Hurk, F. Lentz, R. Waser: Nanobatteries in redox-based resistive switches require extension of memristor theory, 2013, Nature Communications, Volume 4, S. 1771 |
S. Tappertzhofen, H. Mündelein, I. Valov, R. Waser: Nanoionic transport and electrochemical reactions in resistively switching silicon dioxide, 2012, Nanoscale, Volume 4, S. 3040-3043 |
D.Y. Cho, I. Valov, J. van den Hurk, S. Tappertzhofen, R. Waser: Direct Observation of Charge Transfer in Solid Electrolyte for Electrochemical Metallization Memory, 2012, Advanced Materials, Volume 24, S. 4552-4556 |
S. Tappertzhofen, I. Valov, R. Waser: Quantum conductance and switching kinetics of AgI based microcrossbar cells, 2012, Nanotechnology, Volume 23, 145703 |
E. Linn, R. Rosezin, S. Tappertzhofen, U. Böttger, R. Waser: Beyond von Neumann-logic operations in passive crossbar arrays alongside memory operations, 2012, Nanotechnology, Volume 23, 305205 |
S. Tappertzhofen, S. Menzel, I. Valov, R. Waser: Redox Processes in Silicon Dioxide Thin Films using Copper Microelectrodes, 2011, Applied Physics Letters, Volume 99, 203103 |
S. Tappertzhofen, E. Linn, L. Nielen, R. Rosezin, F. Lentz, R. Bruchhaus, I. Valov, U. Böttger, R. Waser: Capacity based Nondestructive Readout for Complementary Resistive Switches, 2011, Nanotechnology, Volume 22, 395203 |
S. Tappertzhofen, M.Hempel, I. Valov, R. Waser: Proton Mobility in SiO2 Thin Films and Impact of Hydrogen and Humidity on the Resistive Switching Effect, 2011, Materials Research Society Symposium Proceedings, 1330 |
M. Röscher, S. Tappertzhofen, T. Schneller: Precursor Homogeneity and Crystallization Effects in Chemical Solution Deposition-Derived Alkaline Niobate Thin Films, 2011, Journal American Ceramic Society, 94, S. 2193-2199 |